Optical coating analyzer
Unlock next-level analysis of highly reflective optical coatings.
Our novel resonator-enhanced imaging technology unlocks a new level of development, process optimization, and quality control for high-end optical coatings, whether for high-power laser applications or low-loss resonators.
Our patented approach enables fast, spatially resolved detection and spectral characterization of individual defects with 0.1 ppm sensitivity. It can distinguish between scattering and absorption, measure quantitative absorption cross sections, and capture phase information.
Core advantages
A multi-analysis system covering UV to 2000 nm for comprehensive assessment of absorption, scattering, and coating quality - all in one device.
Low-Power, Small footprint
Sample GW/cm² power densities using standard low-power diode lasers. Together with the compact 30 × 30 cm² footprint, the microscope drastically reduces requirements regarding space, laser costs and safety.
Photothermal measurements
Use our fast resonator-enhanced photothermal imaging technology (patent pending) to image heat generation at defect sites.
Spectral Characterization
Broadband coverage (VIS/NIR) enables rapid spectral scans of coating defects, providing deeper insights into loss origins and guiding optimized production processes.
Unprecedented Sensitivity -Absolute values
Characterize absorption and other losses with sub-ppm sensitivity in milliseconds. Quantify absolute absorption cross sections of atomistic defects and precursors.
Scattering, absorption, phase
Get the full information on mirror roughness, waviness, defects, reflectivity and all other relevant optical properties with one device.
Low photodamage
Enables fast, non-destructive, spatially resolved inspection of mirror coatings to detect absorption, scattering, or layer imperfections before final integration.
Performance specs
Spectral characterization
Δλ > 150 nm broadband
Quantitative measurements across VIS/NIR 350-2000nm
Power handling
1 GW/cm² power density
High-power locally, low-power input
Resolution
~1 µm
Optical imaging at the diffraction limit
Imaging speed
10s / 0.3 × 0.3 mm²
High-speed imaging capability
Sensitivity
< 1 ppm absorption
Noise floor down to 0.1 ppm within a few ms measurement time
Custom software
Python Interface
Adaptable to integrate your workflow
What can be analyzed?
Your materials:
Crystals, glasses, thin films... .......... ................................................
Optical coatings:
HR, beam splitters, filters ......................................... ......................
Substrates:
Compare the quality of super-polished substrates when coated under identical conditions
High-power laser optics:
LIDT hot spots, localized heating, defect precursors .............................
How it Works
- A Fabry–Pérot cavity is formed between a microscopic fiber mirror and the mirror that should be tested.
- Light circulates inside the cavity and interacts so strongly with the test mirror that tiniest absorption, scattering, and phase defects are revealed with ppm sensitivity.
- Raster-scanning allows high-speed, high-precision imaging across areas up to 300 × 300 µm².
- Diffraction-limited spatial resolution and time-resolved measurements down to the order of a few microseconds, enable detailed defect mapping and coating and substrate analysis.
Applications
The optical coating analyzer platform enables the detection, characterization, and comparison of highly localized and even weakly absorbing spots,
as well as light-induced damage, dirt, and scratches.
Surface topography measurements
Identify nm-scale surface imperfections and local curvatures on mirrors for precision optics.
Your material
Open to explore