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High-precision Optical Coating Analyzer using resonator-enhanced imaging for spatially resolved defect detection and spectral characterization of optical coatings.

Optical coating analyzer

Unlock next-level analysis of highly reflective optical coatings.

Our novel resonator-enhanced imaging technology unlocks a new level of development, process optimization, and quality control for high-end optical coatings, whether for high-power laser applications or low-loss resonators. 


Our patented approach enables fast, spatially resolved detection and spectral characterization of individual defects with 0.1 ppm sensitivity. It can distinguish between scattering and absorption, measure quantitative absorption cross sections, and capture phase information.


Core advantages

A multi-analysis system covering UV to 2000 nm for comprehensive assessment of absorption, scattering, and coating quality - all in one device.

Compact 30 × 30 cm² absorption microscope operating with standard low-power diode lasers, achieving GW/cm² power densities while minimizing space, cost, and safety requirements.

Low-Power, Small footprint

Sample GW/cm² power densities using standard low-power diode lasers. Together with the compact 30 × 30 cm² footprint, the microscope drastically reduces requirements regarding space, laser costs and safety.

Resonator-enhanced photothermal imaging showing localized heat generation at defect sites on optical coatings with high spatial resolution.

Photothermal measurements

Use our fast resonator-enhanced photothermal imaging technology (patent pending) to image heat generation at defect sites.

Broadband VIS/NIR spectral characterization of optical coating mirrors for rapid defect analysis and optimization of coating processes.

Spectral Characterization

Broadband coverage (VIS/NIR) enables rapid spectral scans of coating defects, providing deeper insights into loss origins and guiding optimized production processes.

Data plot demonstrating sub-ppm sensitivity for absolute absorption and loss measurements, enabling quantification of atomic-scale defect cross sections in milliseconds.

Unprecedented Sensitivity -Absolute values

Characterize absorption and other losses with sub-ppm sensitivity in milliseconds. Quantify absolute absorption cross sections of atomistic defects and precursors.

Multi-parameter optical analysis graphs displaying scattering, absorption, and phase measurements for comprehensive coating characterization with a single instrument.

Scattering, absorption, phase

Get the full information on mirror roughness, waviness, defects, reflectivity and all other relevant optical properties with one device.

Scientists using Qlibri’s low-photodamage optical analyzer for fast, spatially resolved, non-destructive inspection of mirror coatings to detect absorption, scattering, and layer imperfections.

Low photodamage

Enables fast, non-destructive, spatially resolved inspection of mirror coatings to detect absorption, scattering, or layer imperfections before final integration.

Performance specs

Spectral characterization

Δλ > 150 nm broadband

Quantitative measurements across VIS/NIR 350-2000nm

Power handling

1 GW/cm² power density

High-power locally, low-power input

Resolution

~1 µm

Optical imaging at the diffraction limit

Imaging speed
10s / 0.3 × 0.3 mm²

High-speed imaging capability

Sensitivity

< 1 ppm absorption

Noise floor down to 0.1 ppm within a few ms measurement time

Custom software

Python Interface

 Adaptable to integrate your workflow

What can be analyzed?

Your materials: 

Crystals, glasses, thin films... .......... ................................................

Optical coatings: 

HR, beam splitters, filters ......................................... ......................

Substrates:

Compare the quality of super-polished substrates when coated under identical conditions

High-power laser optics:

LIDT hot spots, localized heating, defect precursors .............................

How it Works 

  • A Fabry–Pérot cavity is formed between a microscopic fiber mirror and the mirror that should be tested.
  • Light circulates inside the cavity and interacts so strongly with the test mirror that tiniest absorption, scattering, and phase defects are revealed with ppm sensitivity.
  • Raster-scanning allows high-speed, high-precision imaging across areas up to 300 × 300 µm².
  • Diffraction-limited spatial resolution and time-resolved measurements down to the order of a few microseconds, enable detailed defect mapping and coating and substrate analysis.

Close-up of Qlibri Fabry–Pérot microcavity formed between a microscopic fiber mirror and a test mirror, revealing absorption, scattering, and phase defects with ppm sensitivity through raster-scanning imaging.


Applications​

The optical coating analyzer platform enables the detection, characterization, and comparison of highly localized and even weakly absorbing spots,

 as well as light-induced damage, dirt, and scratches.

Surface topography measurements

Identify nm-scale surface imperfections and local curvatures on mirrors for precision optics.

Your material


 Open to explore